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A typical representative of a silicon solar cell consists of a photoactive p/n junction formed on the surface, a front ohmic contact stripe and fingers, a back ohmic contact that covers the entire back surface, and an antireflection coating on the front surface.
For silicon solar cell production either poly-crystalline or mono-crystalline material is used. Poly-crystalline silicon for photo-voltaic applications is normally produced by casting methods while mono-crystalline silicon is prepared in a Czochralski growing process.
The main process steps in solar cell production are the preparation of the p/n junction by doping and the contacting of the photovoltaic cell. Beside that, further deposition processes are used to establish an antireflection coating or to improve the solar cell setup.

Koyo Thermo Systems furnace model 206 is designed for this application and for wafers up to 150mm in diameter and fulfills all requirements of this process. The LGO heating elements that are used in this furnace have a very low thermal mass and can reduce therefore the process time. They can also save energy and costs for the doping process. All normal sizes of solar wafers can be processed in this type of furnace. Liquid POCl3 is supplied in a bubbler. Nitrogen passes at a well defined temperature through the liquid and is transporting the dopant. Typical doping temperatures are 800 - 900C.
For higher
demands to the homogeneity of the doping profile or to the automation
level,
vertical furnaces are available. The
smallest
version of a Koyo Thermo Systems vertical furnace
can be very well used especially for the use in research and
development
of solar cells. The furnace model VF1000 is designed as a mini-batch
furnace,
has a manual loading and is therefore very flexible regarding sample
sizes.
This vertical furnace is equipped with a cost saving LGO heating element.
The process performance equals the big production versions of vertical
furnaces
for IC production. The price of this unit is similar to the price of a
horizontal
tube in a horizontal furnace model 206.
For mass production, Koyo Thermo Systems developed a special vertical furnace, which gives better process results compared to a horizontal one, but still does not increase much the production costs for solar cells. This twin furnace loads 3-4 boats in one vertical tube and has therefore a capacity of 600-800 solar cells. This is the same capacity that you get on a horizontal furnace. Automation is easier to do on a vertical furnace.
In semiconductor technology three methods are used for the deposition of layers on semiconductor wafers:
APCVD. Atmospheric Pressure Chemical Vapor Deposition requires rather high temperatures and is used
only for very few applications like the formation of epitaxial silicon.
LPCVD. Low Pressure Chemical Vapor Deposition is widely used for the deposition of silicon oxide,
nitride and poly-silicon. The process is performed in tube furnaces and requires
also rather high temperatures.
PECVD. Plasma Enhanced Chemical Vapor Deposition is mainly used for the deposition of dielectric films
and passivation films like silicon oxide or nitride or ONO layers at low temperature. It can be also used for
SiC layers of poly-Silicon deposition. The necessary energy for the chemical reaction is not introduced by
heating the whole reaction chamber but just by heated gas or plasma. It is the best method, if dopant diffusion
has to be kept low, wafers have to be treated, which are sensible to high temperature or have been aluminium
metallized already. The thermal budget of the treated wafers stays low with PECVD.
Using an RF generator, the plasma is formed in the reaction chamber. It contains reactive ions and radicals.
The growth of the deposit starts easily because of the activation and cleaning of the surface by the more of
less intense bombarding with ions from the plasma. You get good adhesion and high growth rates.
The properties of the coated layers can be better influenced with PECVD than in simply thermal deposition technique,
because more process parameters can be varied. Important are the adjustment of adhesion, compressive and tensile
stress causing warpage, hydrogen content and density, etchability, etch rate and selectivity in etching, step
coverage as well as stoichiometry (consistence) and cleanliness of the deposited layers, which can be measured
by the refractive index. The maximum thickness of the deposit and the best uniformity of the coating is also
dependent of the PECVD process parameters. Some film properties can be modified also subsequently.
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